written by Mark R. Flowers

The well-defined structure of nanotubes makes them ideal for demonstrating the
influence the structure of the end of an Atomic Force Microscope tip has on a measured image. These materials describe the basics of operating an Atomic Force Microscope and imaging a carbon nanotube sample in both contact mode and dynamic force mode. An introduction to how the AFM scans the surface and interprets interactions into 3D images and information on image analysis is provided in a supplemental document.

The experiment was performed during the Introduction to Nanoscale Imaging with the Atomic Force Microscope workshop at the 2009 Topical Conference on Advanced Laboratories.

• Download TCAL09_Flowers_Nanotubes.pdf - 232kb Adobe PDF Document

Published July 25, 2009
Last Modified June 7, 2012

This file is included in the full-text index.

This document provides an introduction to Atomic Force Microscopy (AFM) including AFM setup, the force sensor, the position detector, the feedback system, and the contact and non-contact operation modes.

• Download TCAL09_Flowers_AFM.pdf - 361kb Adobe PDF Document

Last Modified June 7, 2012

This file is included in the full-text index.