2009 Advanced Laboratories Conference Abstract Detail Page
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| Abstract Title: |
Introduction to Nanoscale Imaging with the Atomic Force Microscope |
| Abstract: |
Participants will learn the basics of operating an Atomic Force Microscope by imaging nanoscale particles in both contact mode and dynamic force mode. This will include an introduction to how the AFM scans the surface and interprets interactions into 3D images. Software to measure cross-sections of nanoparticles will be demonstrated as well as additional off-line analysis of data. |
| Abstract Type: |
Workshop
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Workshop Documents |
| Workshop Document: |
Download the Workshop Document
|
| Workshop Document (2): |
Download the Workshop Document (2)
|
| Session: |
Session XI - Parallel Workshops
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Author/Organizer Information |
| Primary Contact: |
Mark R. Flowers
Nanoscience Instruments, Inc
Phone: 1-480-940-3940
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