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Low-Cost Capacitance Profiling of a Semiconductor
written by
Dr John Essick
A low-cost capacitance-based experiment to measure the doping density of a silicon sample is described. Our sample is a commercially produced Schottky diode. The phasesensitive detection required to measure the sample's capacitance is carried out using an inexpensive data acquisition (DAQ) device and a software program that implements the lock-in detection algorithm. We show experimental set-ups appropriate for two low-cost DAQ devices, where each set-up takes into account the limitations of each DAQ device (the USB-6009 device with restricted analog input and inadequate waveform generation capabilities; the myDAQ device with no hardware triggering). Excellent results for the sample's doping density and built-in potential are obtained from each set-up.
Presented at the 2013 AAPT Summer Meeting, W36: Advanced Labs Workshop
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Record Link
<a href="https://www.compadre.org/portal/items/detail.cfm?ID=12912">Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. July 9, 2013.</a>
AIP Format
J. Essick, , WWW Document, (https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471).
AJP/PRST-PER
J. Essick, Low-Cost Capacitance Profiling of a Semiconductor, <https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471>.
APA Format
Essick, J. (2013, July 9). Low-Cost Capacitance Profiling of a Semiconductor. Retrieved May 1, 2025, from https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
Chicago Format
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. July 9, 2013. https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 (accessed 1 May 2025).
MLA Format
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. 9 July 2013. 1 May 2025 <https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471>.
BibTeX Export Format
@misc{
Author = "John Essick",
Title = {Low-Cost Capacitance Profiling of a Semiconductor},
Volume = {2025},
Number = {1 May 2025},
Month = {July 9, 2013},
Year = {}
}
Refer Export Format
%A John Essick %T Low-Cost Capacitance Profiling of a Semiconductor %D July 9, 2013 %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 %O application/pdf
EndNote Export Format
%0 Electronic Source %A Essick, John %D July 9, 2013 %T Low-Cost Capacitance Profiling of a Semiconductor %V 2025 %N 1 May 2025 %8 July 9, 2013 %9 application/pdf %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.
Citation Source Information
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