edited by Laboratory Physicist Dean Hudek

The purpose of this laboratory is to learn about and observe certain properties of a two-dimensional system. The system to be used is the inversion layer of a silicon MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor). By making conductance measurements in a magnetic field, Landau levels can be observed whose properties can be used, in conjunction with other information, to verify the two-dimensionality of the inversion layer and to derive some of the physical parameters of the MOSFET.

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Last Modified August 3, 2011

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