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written by David Windt
IMD is a point-and-click IDL application that can calculate specular and non-specular (diffuse) optical functions of an arbitrary multilayer structure, i.e., a structure consisting of any number of layers of any thickness, and of any material.
Subjects Levels Resource Types
General Physics
- Properties of Matter
Optics
- Photometry
- Graduate/Professional
- Instructional Material
= Interactive Simulation
Intended Users Formats Ratings
- Researchers
- text/html
- application/exe
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Access Rights:
Limited free access
Uses the IDL platform
Restriction:
© 1998 David Windt
Keywords:
absorbtance, electric field intensities, ellipsometriy, optical properties, phase shifts, reflectance, transmittance
Record Creator:
Date Metadata Instance was created July 16, 2003 by Waylon Flinn
Record Updated:
August 24, 2016 by Lyle Barbato
Last Update
when Cataloged:
April 7, 2015
Other Collections:

ComPADRE is beta testing Citation Styles!

Record Link
AIP Format
D. Windt, , Version 5.04 (1998), WWW Document, (http://www.rxollc.com/idl/index.html).
AJP/PRST-PER
D. Windt, IMD – Modeling and Analysis of Multilayer Films, , Version 5.04 (1998), <http://www.rxollc.com/idl/index.html>.
APA Format
Windt, D. (2015, April 7). IMD – Modeling and Analysis of Multilayer Films. Retrieved December 12, 2017, from http://www.rxollc.com/idl/index.html
Chicago Format
Windt, David. IMD – Modeling and Analysis of Multilayer Films. April 7, 2015. http://www.rxollc.com/idl/index.html (accessed 12 December 2017).
MLA Format
Windt, David. IMD – Modeling and Analysis of Multilayer Films. Vers. 5.04. 1998. 7 Apr. 2015. 12 Dec. 2017 <http://www.rxollc.com/idl/index.html>.
BibTeX Export Format
@misc{ Author = "David Windt", Title = {IMD – Modeling and Analysis of Multilayer Films}, Volume = {2017}, Number = {12 December 2017}, Month = {April 7, 2015}, Year = {1998} }
Refer Export Format

%A David Windt
%T IMD – Modeling and Analysis of Multilayer Films
%D April 7, 2015
%U http://www.rxollc.com/idl/index.html
%O 5.04
%O text/html

EndNote Export Format

%0 Electronic Source
%A Windt, David
%D April 7, 2015
%T IMD – Modeling and Analysis of Multilayer Films
%V 2017
%N 12 December 2017
%7 5.04
%8 April 7, 2015
%9 text/html
%U http://www.rxollc.com/idl/index.html


Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.

Citation Source Information

The AIP Style presented is based on information from the AIP Style Manual.

The APA Style presented is based on information from APA Style.org: Electronic References.

The Chicago Style presented is based on information from Examples of Chicago-Style Documentation.

The MLA Style presented is based on information from the MLA FAQ.

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