Detail Page

written by Michael Davidson, Daniel Axelrod, and John Long
published by the Olympus America, Inc. and the National High Magnetic Field Laboratory
This item is an interactive Java simulation relating to TIRF (total internal reflection fluorescence microscopy).  It depicts the penetration depth of an evanescent field in which waves are propagated to excite fluorophores near the surface interface.  The user can manipulate the incident angle and wavelength, and select from a variety of refractive/reflective indices.  This simulation is part of a larger collection of tutorials and curriculum support on fluorescence  microscopy.

Please note that this resource requires Java.
Subjects Levels Resource Types
Optics
- Geometrical Optics
= Optical Instruments
= Total Internal Reflection
- Lower Undergraduate
- Instructional Material
= Interactive Simulation
= Tutorial
- Reference Material
Intended Users Formats Ratings
- Learners
- Educators
- application/java
- text/html
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Access Rights:
Free access
Restriction:
© 1998 National High Magnetic Field Laboratory-2008
Keywords:
Simulations, TIRF, evanescent field, evanescent wave, fluorescence microscopy, microscopy, optics, total internal reflection fluorescence, tutorials, virtual microscopes
Record Cloner:
Metadata instance created March 26, 2008 by Caroline Hall
Record Updated:
March 27, 2008 by Caroline Hall
Last Update
when Cataloged:
June 15, 2006
Other Collections:

ComPADRE is beta testing Citation Styles!

Record Link
AIP Format
M. Davidson, D. Axelrod, and J. Long, (Olympus America, Inc., Center Valley, 1998), WWW Document, (https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html).
AJP/PRST-PER
M. Davidson, D. Axelrod, and J. Long, Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth (Olympus America, Inc., Center Valley, 1998), <https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html>.
APA Format
Davidson, M., Axelrod, D., & Long, J. (2006, June 15). Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth. Retrieved October 4, 2024, from Olympus America, Inc.: https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html
Chicago Format
Davidson, M, D. Axelrod, and J. Long. Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth. Center Valley: Olympus America, Inc., June 15, 2006. https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html (accessed 4 October 2024).
MLA Format
Davidson, Michael, Daniel Axelrod, and John Long. Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth. Center Valley: Olympus America, Inc., 1998. 15 June 2006. 4 Oct. 2024 <https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html>.
BibTeX Export Format
@misc{ Author = "Michael Davidson and Daniel Axelrod and John Long", Title = {Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth}, Publisher = {Olympus America, Inc.}, Volume = {2024}, Number = {4 October 2024}, Month = {June 15, 2006}, Year = {1998} }
Refer Export Format

%A Michael Davidson %A Daniel Axelrod %A John Long %T Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth %D June 15, 2006 %I Olympus America, Inc. %C Center Valley %U https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html %O application/java

EndNote Export Format

%0 Electronic Source %A Davidson, Michael %A Axelrod, Daniel %A Long, John %D June 15, 2006 %T Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth %I Olympus America, Inc. %V 2024 %N 4 October 2024 %8 June 15, 2006 %9 application/java %U https://micro.magnet.fsu.edu/primer/java/tirf/penetration/index.html


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Citation Source Information

The AIP Style presented is based on information from the AIP Style Manual.

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Molecular Expressions: Interactive Java Tutorials - Evanescent Field Penetration Depth:

Is Part Of Molecular Expressions: Total Internal Reflection Fluorescence Microscopy

This is the larger collection of materials on TIRF (total internal reflection fluorecence).  It contains information on fundamental concepts and theory, as well as multiple java simulations.

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