published by
the Institute of Electrical and Electronics Engineers
supported by the International Business Machines
This lesson suggests a physical model to explore how scanning probe microscopes work to "see" nanoscale samples and translate the data into a 3D image. The lesson opens with background information about scanning probe and atomic force microscopes. Next, blindfolds are applied and learners use only the tip of a pencil to explore and identify the shape of objects they cannot see, just as the SPM does at the nano level. The driving question of the lesson: How do scientists measure the surface of objects that are too small to see?
This lesson follows a module format that includes student guides, recommended reading, illustrated procedures, worksheets, and background information about the engineering connections. This collection is part of TryEngineering.org, a website maintained by the Institute of Electrical and Electronics Engineers (IEEE). See Related Materials for links to high-quality animated tutorials of scanning probe microscopy and scanning electron microscopy.
AAAS Benchmark Alignments (2008 Version)3. The Nature of Technology
3A. Technology and Science
4. The Physical Setting
4D. The Structure of Matter
8. The Designed World
8B. Materials and Manufacturing
11. Common Themes
11B. Models
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<a href="https://www.compadre.org/portal/items/detail.cfm?ID=12291">International Business Machines. TryEngineering: Be A Scanning Probe Microscope . Institute of Electrical and Electronics Engineers, July 26, 2012.</a>
AIP Format
(Institute of Electrical and Electronics Engineers, 2012), WWW Document, (https://tryengineering.org/teacher/be-scanning-probe-microscope/).
AJP/PRST-PER
TryEngineering: Be A Scanning Probe Microscope (Institute of Electrical and Electronics Engineers, 2012), <https://tryengineering.org/teacher/be-scanning-probe-microscope/>.
APA Format
TryEngineering: Be A Scanning Probe Microscope . (2012, July 26). Retrieved November 11, 2024, from Institute of Electrical and Electronics Engineers: https://tryengineering.org/teacher/be-scanning-probe-microscope/
Chicago Format
International Business Machines. TryEngineering: Be A Scanning Probe Microscope . Institute of Electrical and Electronics Engineers, July 26, 2012. https://tryengineering.org/teacher/be-scanning-probe-microscope/ (accessed 11 November 2024).
MLA Format
TryEngineering: Be A Scanning Probe Microscope . Institute of Electrical and Electronics Engineers, 2012. 26 July 2012. International Business Machines. 11 Nov. 2024 <https://tryengineering.org/teacher/be-scanning-probe-microscope/>.
BibTeX Export Format
@misc{
Title = {TryEngineering: Be A Scanning Probe Microscope },
Publisher = {Institute of Electrical and Electronics Engineers},
Volume = {2024},
Number = {11 November 2024},
Month = {July 26, 2012},
Year = {2012}
}
Refer Export Format
%T TryEngineering: Be A Scanning Probe Microscope %D July 26, 2012 %I Institute of Electrical and Electronics Engineers %U https://tryengineering.org/teacher/be-scanning-probe-microscope/ %O text/html
EndNote Export Format
%0 Electronic Source %D July 26, 2012 %T TryEngineering: Be A Scanning Probe Microscope %I Institute of Electrical and Electronics Engineers %V 2024 %N 11 November 2024 %8 July 26, 2012 %9 text/html %U https://tryengineering.org/teacher/be-scanning-probe-microscope/ Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.
Citation Source Information
The AIP Style presented is based on information from the AIP Style Manual. The APA Style presented is based on information from APA Style.org: Electronic References. The Chicago Style presented is based on information from Examples of Chicago-Style Documentation. The MLA Style presented is based on information from the MLA FAQ. TryEngineering: Be A Scanning Probe Microscope :
Is Supplemented By
Virtual Microscope: Scanning Probe Microscopy Basics
An animated tutorial that describes how scanning probe microscopes work to "read" the surface of nanoscale samples and provide image data. relation by Caroline Hall
Is Supplemented By
Virtual Microscope: Scanning Electron Microscopy Basics
An animated tutorial on the structure and function of a Scanning Electron Microscope (SEM). Appropriate for high school and undergraduate education. relation by Caroline HallKnow of another related resource? Login to relate this resource to it. |
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