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published by
the University of Wisconsin MRSEC
supported by the National Science Foundation
This unique activity for middle school allows students to mimic the action of a scanning probe microscope as they figure out what's in the "mystery box", using only chopsticks as probes for mapping the mysterious object. They record data by using centimeter marks on the chopsticks and work cooperatively to analyze the data. The lesson was developed to help students understand how scanning probe microscopy (SPM) can "see" things on an atomic scale by using a sharp probe tip to map surfaces of the nanoscale object.
Editor's Note: SPM technology was invented in the 1980's by IBM scientists. It is a highly sensitive scanner that requires almost total isolation from outside mechanical vibrations. It is essential to nanotechnologists for imaging specimens at the atomic/molecular level. See Related Materials for a link to a comprehensive tutorial on SPM technology, appropriate for teachers.
AAAS Benchmark Alignments (2008 Version)4. The Physical Setting
4D. The Structure of Matter
8. The Designed World
8B. Materials and Manufacturing
11. Common Themes
11B. Models
11D. Scale
12. Habits of Mind
12C. Manipulation and Observation
12D. Communication Skills
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Record Link
<a href="https://www.compadre.org/portal/items/detail.cfm?ID=11320">National Science Foundation. Exploring the Nanoworld: How Can We "See" What We Cannot See?. Madison: University of Wisconsin MRSEC, April 24, 2009.</a>
AIP Format
(University of Wisconsin MRSEC, Madison, 2003), WWW Document, (http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html).
AJP/PRST-PER
Exploring the Nanoworld: How Can We "See" What We Cannot See? (University of Wisconsin MRSEC, Madison, 2003), <http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html>.
APA Format
Exploring the Nanoworld: How Can We "See" What We Cannot See?. (2009, April 24). Retrieved November 11, 2024, from University of Wisconsin MRSEC: http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html
Chicago Format
National Science Foundation. Exploring the Nanoworld: How Can We "See" What We Cannot See?. Madison: University of Wisconsin MRSEC, April 24, 2009. http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html (accessed 11 November 2024).
MLA Format
Exploring the Nanoworld: How Can We "See" What We Cannot See?. Madison: University of Wisconsin MRSEC, 2003. 24 Apr. 2009. National Science Foundation. 11 Nov. 2024 <http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html>.
BibTeX Export Format
@misc{
Title = {Exploring the Nanoworld: How Can We "See" What We Cannot See?},
Publisher = {University of Wisconsin MRSEC},
Volume = {2024},
Number = {11 November 2024},
Month = {April 24, 2009},
Year = {2003}
}
Refer Export Format
%T Exploring the Nanoworld: How Can We "See" What We Cannot See? %D April 24, 2009 %I University of Wisconsin MRSEC %C Madison %U http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html %O text/html
EndNote Export Format
%0 Electronic Source %D April 24, 2009 %T Exploring the Nanoworld: How Can We "See" What We Cannot See? %I University of Wisconsin MRSEC %V 2024 %N 11 November 2024 %8 April 24, 2009 %9 text/html %U http://education.mrsec.wisc.edu/modules/MiddleSchool/SPM/index.html Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.
Citation Source Information
The AIP Style presented is based on information from the AIP Style Manual. The APA Style presented is based on information from APA Style.org: Electronic References. The Chicago Style presented is based on information from Examples of Chicago-Style Documentation. The MLA Style presented is based on information from the MLA FAQ. Exploring the Nanoworld: How Can We "See" What We Cannot See?:
Is Supplemented By
Optical Microscopy Primer
This tutorial provides extensive background information on the group of instruments referred to as scanning probe microscopes (SPMs). Included are four interactive simulations that depict how SPM works and the Van der Waals forces at play between the SPM probe tip and the specimen. relation by Caroline HallKnow of another related resource? Login to relate this resource to it. |
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