The Thin Film Interference model investigates reflection and transmission of light through a thin film. The user can change the thickness and index of refraction of the thin film as well as the incident light wavelength.
The Thin Film Interference Model was created using the Easy Java Simulations (EJS) modeling tool. It is distributed as a ready-to-run (compiled) Java archive. Double clicking the ejs_bu_ThinFilm.jar file will run the program if Java is installed.
Please note that this resource requires
at least version 1.5 of
Thin Film Interference Model Source Code
The source code zip archive contains an XML representation of the Thin Film Interference model. Unzip this archive in your EJS workspace to compile and run this model using EJS. download 8kb .zip
Published: April 24, 2010
Rights: This material is released under the GNU General Public License Version 3.
%0 Computer Program %A Duffy, Andrew %D April 24, 2010 %T Thin Film Interference Model %8 April 24, 2010 %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=9990&DocID=1627
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