A low-cost capacitance-based experiment to measure the doping density of a silicon sample is described. Our sample is a commercially produced Schottky diode. The phasesensitive detection required to measure the sample's capacitance is carried out using an inexpensive data acquisition (DAQ) device and a software program that implements the lock-in detection algorithm. We show experimental set-ups appropriate for two low-cost DAQ devices, where each set-up takes into account the limitations of each DAQ device (the USB-6009 device with restricted analog input and inadequate waveform generation capabilities; the myDAQ device with no hardware triggering). Excellent results for the sample's doping density and built-in potential are obtained from each set-up.
Presented at the 2013 AAPT Summer Meeting, W36: Advanced Labs Workshop.
%0 Electronic Source %A Essick, John %D July 9, 2013 %T Low-Cost Capacitance Profiling of a Semiconductor %V 2018 %N 18 August 2018 %8 July 9, 2013 %9 application/pdf %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.