2018 BFY III Abstract Detail Page

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Abstract Title: W40: Atomic Force Microscopy in Materials Science: nanomechanics and nanotribology
Abstract: The atomic force microscope (AFM) is a becoming an indispensable tool in the fields of 2D materials, nanofabrication and polymer science.  The AFM offers several advantages to optical and electron microscopy including sub-nanometer resolution, easier sample preparation and the ability to measure additional surface properties such as electrical and magnetic characteristics.  In this session, general AFM theory will be reviewed with an emphasis on material contrast imaging (phase contrast), stiffness and adhesion mapping (force spectroscopy), and frictional imaging (lateral force microscopy).
Abstract Type: Workshop

Author/Organizer Information

Primary Contact: Edward Nelson
Nanosurf, Inc.