The Two-Color Multiple Slit Diffraction Model allows users to explore multiple slit diffraction by manipulating characteristics of the aperture and incident light to observe the resulting intensity. An exploration of resolving power in spectroscopy is included in the model.
The Two-Color Multiple Slit Diffraction Model was created by Michael Gallis using the Easy Java Simulations (EJS) modeling tool. It is distributed as a ready-to-run (compiled) Java archive. You can examine and modify this compiled EJS model if you run the model (double click on the model's jar file), right-click within a plot, and select "Open Ejs Model" from the pop-up menu. You must, of course, have EJS installed on your computer.
Please note that this resource requires
at least version 1.5 of Java (JRE).
Two-Color Multiple Slit Diffraction Source Code
The source code zip archive contains an XML representation of the EJS Two-Color Multiple Slit Diffraction Model. Unzip this archive in your EJS workspace to compile and run this model using EJS. download 2003kb .zip
Last Modified: June 13, 2014
previous versions
Author: Diego Racero
Posted: February 22, 2010 at 12:19PM
Hi, I was using your simulation and I noted that each time I increment the slit number the intensity amplitude is rescale so it fit in the screen without any change, could you tell which variable I must maipulate in order tu put in evidence the scale change?
M. Gallis, Computer Program TWO-COLOR MULTIPLE SLIT DIFFRACTION (2008), <https://www.compadre.org/Repository/document/ServeFile.cfm?ID=8888&DocID=1192>.
Gallis, M. (2008). Two-Color Multiple Slit Diffraction [Computer software]. Retrieved October 6, 2024, from https://www.compadre.org/Repository/document/ServeFile.cfm?ID=8888&DocID=1192
%0 Computer Program %A Gallis, Michael %D October 27, 2008 %T Two-Color Multiple Slit Diffraction %8 October 27, 2008 %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=8888&DocID=1192
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