This model simulates concepts of X-Ray imaging, exploring how different aspects of the X-Ray source and the sample affect the X-Ray image by experimenting with a simulated X-Ray image of two cylinders embedded in a slab of material. Note: after any parameter is changed, the "Expose" button must be clicked to create the simulated exposure.

Users are able control The X-Ray properties through kVp (kiloVolts peak), the cathode electron beam accelerating potential). The image exposure is adjusted through the combined parameter mAs (milliAmp seconds) which controls the beam intensity (through the cathode current) and the exposure time. The beam can be modified further by placing a filter in the X-Ray beam. The user can set the filter's effective atomic number, density and thickness independently. Ripple (represented here as a percentage of kVp) in the high voltage is created during rectification and effectively averages the X-Ray production over the range of actual values of the high voltage. Source to Image Distance (SID) affects the intensity of the X-Rays at the image receptor (or film) through the inverse square law. Changing the size of the film/image receptor allows the user to zoom in or zoom out of the image.

The simulated sample consists of two cylinders embedded in a slab of material. Users can control the dimensions and composition of the cylinders and slab to see how those factors affect the contrast in the simulated image.