This National Science Foundation news release presents a newly introduced technique, involving simple materials and instruments, for studying the mechanical properties of nanometer films. The release explains how these measurements are made and why they are important.
National Science Foundation. A New Wrinkle in Thin Film Science. Arlington: National Science Foundation, August 3, 2007. http://www.nsf.gov/news/news_summ.jsp?cntn_id=109673&org=NSF (accessed 23 October 2014).
%0 Electronic Source %D August 3, 2007 %T A New Wrinkle in Thin Film Science %I National Science Foundation %V 2014 %N 23 October 2014 %8 August 3, 2007 %9 image/jpeg %U http://www.nsf.gov/news/news_summ.jsp?cntn_id=109673&org=NSF
Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.