2009 Advanced Laboratories Conference Abstract Detail Page
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||Modern Interferometry B
||Available only to those who have taken the session Modern Interferometry A.
Participants will see, at level B, Applications of Interferometry:
- how to make controlled and measurable sub-micron displacements of one mirror in the interferometer
- how to process fringe signals electronically, and how to 'count fringes', in order to measure the wavelength of light directly with a micrometer
- how to derive an experimentally-measured value of the wavelength of light.
Download the Workshop Document
||Session V - Parallel Workshops
Dr. Jonathan F. Reichert