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2009 Advanced Laboratories Conference Abstract Detail Page
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||Electrical Characterization of Photovoltaic Materials and Solar Cells with the Keithley Model 4200-SCS Semiconductor Characterization System
||The Keithley Model 4200-SCS provides a total system solution for DC I-V, C-V, and pulse characterization and stress-measure/reliability testing of a large variety of nanotech and semiconductor devices. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization. The 4200-SCS combines unprecedented measurement speed and accuracy with an embedded Windows®-based PC and the Keithley Interactive Test Environment (KITE) to provide a powerful single-box solution.
In this workshop we demonstrate the broad capability of the 4200-SCS using a solar cell as an example device. Because of the increasing demand for energy and the limited supply of fossil fuels, much research is being done on solar or photovoltaic (PV) cells which convert light energy into useful electrical power. When the cell is illuminated, optically generated carriers produce an electric current when the cell is connected to a load.
Some of the electrical tests commonly performed on solar cells involve measuring current and capacitance as a function of an applied DC voltage. Capacitance measurements are sometimes made as a function of frequency or AC voltage. These measurements are usually performed at different light intensities and under different temperature conditions. A variety of important device parameters can be extracted from the current-voltage
(I-V) and capacitance-voltage (C-V) measurements, including output current, conversion efficiency, maximum power output, doping density, resistivity, etc. Electrical characterization is important in determining how to make the cells as efficient as possible with minimal losses."
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||Session V - Parallel Workshops