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written by Dr John Essick
A low-cost capacitance-based experiment to measure the doping density of a silicon sample is described. Our sample is a commercially produced Schottky diode. The phasesensitive detection required to measure the sample's capacitance is carried out using an inexpensive data acquisition (DAQ) device and a software program that implements the lock-in detection algorithm. We show experimental set-ups appropriate for two low-cost DAQ devices, where each set-up takes into account the limitations of each DAQ device (the USB-6009 device with restricted analog input and inadequate waveform generation capabilities; the myDAQ device with no hardware triggering). Excellent results for the sample's doping density and built-in potential are obtained from each set-up.

Presented at the 2013 AAPT Summer Meeting,
W36: Advanced Labs Workshop.
Subjects Lab Level Resource Types
Modern Physics
- Condensed Matter
- Intermediate Undergraduate
- Instructional Material
= Instructor Guide/Manual
= Laboratory
Material Category Formats Ratings
- Lab Manual
- application/pdf
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Format:
application/pdf
Access Rights:
Free access
Restriction:
Has a copyright or other licensing restriction.
Keywords:
Capacitance-Voltage Profiling, Low-Cost Instructional Laboratory Experiment, Semiconductor Physics, Solid State Physics
Record Creator:
Metadata instance created July 9, 2013 by Ramon Torres-Isea
Record Updated:
July 9, 2013 by Ramon Torres-Isea
Last Update
when Cataloged:
July 9, 2013
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Record Link
AIP Format
J. Essick, , WWW Document, (http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471).
AJP/PRST-PER
J. Essick, Low-Cost Capacitance Profiling of a Semiconductor, <http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471>.
APA Format
Essick, J. (2013, July 9). Low-Cost Capacitance Profiling of a Semiconductor. Retrieved July 30, 2014, from http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
Chicago Format
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. July 9, 2013. http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 (accessed 30 July 2014).
MLA Format
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. 9 July 2013. 30 July 2014 <http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471>.
BibTeX Export Format
@misc{ Author = "John Essick", Title = {Low-Cost Capacitance Profiling of a Semiconductor}, Volume = {2014}, Number = {30 July 2014}, Month = {July 9, 2013}, Year = {} }
Refer Export Format

%A John Essick
%T Low-Cost Capacitance Profiling of a Semiconductor
%D July 9, 2013
%U http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
%O application/pdf

EndNote Export Format

%0 Electronic Source
%A Essick, John
%D July 9, 2013
%T Low-Cost Capacitance Profiling of a Semiconductor
%V 2014
%N 30 July 2014
%8 July 9, 2013
%9 application/pdf
%U http://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471


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