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The Thin Film Interference model investigates reflection and transmission of light through a thin film. The user can change the thickness and index of refraction of the thin film as well as the incident light wavelength.
The Thin Film Interference Model was created using the Easy Java Simulations (EJS) modeling tool. It is distributed as a ready-to-run (compiled) Java archive. Double clicking the ejs_bu_ThinFilm.jar file will run the program if Java is installed.
Last Modified April 24, 2010
The source code zip archive contains an XML representation of the Thin Film Interference model. Unzip this archive in your EJS workspace to compile and run this model using EJS.
This material is released under the GNU General Public License Version 3.
Published April 24, 2010
Last Modified April 26, 2010
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