The Thin Film Interference model investigates reflection and transmission of light through a thin film. The user can change the thickness and index of refraction of the thin film as well as the incident light wavelength.
The Thin Film Interference Model was created using the Easy Java Simulations (EJS) modeling tool. It is distributed as a ready-to-run (compiled) Java archive. Double clicking the ejs_bu_ThinFilm.jar file will run the program if Java is installed.
Please note that this resource requires
at least version 1.5 of
Thin Film Interference Model Source Code
The source code zip archive contains an XML representation of the Thin Film Interference model. Unzip this archive in your EJS workspace to compile and run… more... download 7kb .zip
Rights: This material is released under the GNU General Public License Version 3.
Published: April 24, 2010
%0 Computer Program %A Duffy, Andrew %D April 24, 2010 %T Thin Film Interference Model %8 April 24, 2010 %U http://www.compadre.org/Repository/document/ServeFile.cfm?ID=9990&DocID=1627
Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.